Abstract
The results obtained using high-voltage scanning electron microscopy (SEM), which enables observation of the structure of the conductive network within the surface layer of reticulate-doped polymer films, are reported. The submicroscopic structure of the tetrathiotetracene-tetracyanoquinodimethane (TTT-TCNQ) network in amorphous polymers is presented and its implications for the conductivity mechanism are discussed. The SEM pictures obtained reveal the fibrous internal structure of the conductive network in bulk-conductive films obtained using the amorphous polymers polycarbonate and poly(methylmethacrylate). TTT-TCNQ crystallites in the surface-conductive film have a different form in spite of the same polymer being used as the matrix.
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