Abstract
Electron beam lithography followed by ion beam sputtering allowed us to etch periodic structures (dots or stripes) of submicron scale in magnetic (Au/Co/Au) or non-magnetic (Al/Cu) thin layers. Preliminary Brillouin scattering experiments were performed on Au/Co/Au multilayers. The magnetic properties of the unstructured area were not significantly altered by the unutilized deposition-dissolution process of the resist. On stripe-structured areas, a slight positive shift of the Damon-Eschbach (DE) mode frequency was observed when the magnetization was parallel to the Co stripes and the in-plane wave vector perpendicular to them, whereas a more important negative shift, probably due to the demagnetizing field, appeared for magnetization perpendicular and in-plane wave vector parallel to the stripes. In the first geometry, for quasi-normal incidence (θ i = 1°) and low applied field (250 Oe), a significant broadening of the DE mode occurs.
Published Version
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