Abstract
A subcell modeling technique for frequency-dependent thin layers in finite-difference time-domain method is introduced. The proposed method is based on the application of the integral form of the Maxwell–Ampere equation and the solution of a set of auxiliary equations to advance the field components. It has the ability to handle one or several frequency-dependent thin layers embedded in a frequency-dependent medium without solving high-order differential equations. To validate our proposed method, we compare the obtained results with analytical solutions and with numerical references in both time domain and frequency domain.
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