Abstract
In this paper, Zinc oxide were deposited on a glass substrate at room temperature (RT) and two annealing temperatures 350ºC and 500ºC using laser induced plasma technique. ZnO nanofilms of 200nm thickness have been deposited on glass substrate. X-RAY diffraction (XRD), atomic force microscopy and UV-visible spectrophotometer were used to analyze the results. XRD forms of ZnO nanostructure display hexagonal structure with three recognized peaks (100), (002), and (101) orientations at 500ºC annealing temperature. The optical properties of ZnO nanostructure were determined spectra. The energy gap was 3.1 eV at 300 oC and 3.25eV at 500ºC annealing temperature.
Highlights
ZnO is a semiconductor material, it has numerous applications because they have direct and great energy gap 3.3 eV that near to UV region
The peaks of ZnO were seen more clearly at 500 °C, where note that the intensity of peaks increase with increasing annealing temperature .This is due to the fact that the peaks and the crystalline size of the nanofilm increases with increasing temperature due to lower pressure with this increase
Table-2 the grain size be highest value at the highest annealing temperature, while the average roughness and the root mean square were lowered value. These results indicate the average grain size has a direct relationship with increasing annealing temperature but the average roughness and the root mean square decreasing with increasing of temperature
Summary
ZnO is a semiconductor material, it has numerous applications because they have direct and great energy gap 3.3 eV that near to UV region. One of the most common and attractive techniques used to prepare nanostructure thin films that have a characteristic is laser induced plasma (LIP) technique [9]. Laser induced plasma (LIP) technique is using to obtain high quality nanofilms of metal oxide materials [10]. Glass substrates of (2.5×7.5) cm are cleaned by ultrasonic device using water for (10 minutes) and use acetone for (10 minutes). The structural properties of the nanofilms for ZnO were examined using XRD analysis type (SHIMADZU6000 X-ray diffract meter system). The optical properties of nanofilms were examined using (UV/ Visible SP-8001 spectrophotometer)
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