Abstract
A method of study of weakly-formed negative ions by excitation in laser light and accelerator mass spectrometry is described. Measurement of the photoelectric detachment cross section of the extra electron as a function of the photon energy gives information on the electron affinity. Absolute cross sections for photodetachment of negative ions of La, Ce, Th and U have been measured at the fundamental wavelength (1064 nm) of a Nd: YAG laser. To demonstrate the feasibility of determination of the electron affinity by this method, measurements near the threshold of photodetachment in Te with known electron affinity (1.971 eV) were performed.
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