Abstract
Au ultrafine particles-polyethylene thin films and C 60-polyethylene thin films have been prepared in an ionized-cluster-beam time-of-flight mass spectrometer system and analysed by transmission electron microscopy. We found that the small Au clusters with a size of 2.0–5.0 nm are suspended randomly in the polyethylene thin films, and the C 60-polyethylene thin films are f.c.c. structures with a lattice constant a of 1.454 nm.
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