Abstract
Superlattice-like phase change optical disks, where the recording layer consists of alternating thin layers with two different phase change materials of GeTe and Sb2Te3, have been fabricated. The optical and thermal properties were simulated and measured. Samples were measured by X-ray diffraction (XRD) after annealing. The peaks of Ge2Sb2Te5 were observed, which indicates that Ge2Sb2Te5 was formed at the interface between GeTe and Sb2Te3. The recording, erasing and overwriting properties were investigated. The signal differentiation in writing, reading and erasing was observed at the pulse width of 7 ns, which indicates that the superlattice-like structure can effectively shorten the crystallization time. The overwriting cycle was measured using a static tester. Within 10000 times no significant change in the modulation amplitude was observed.
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