Abstract
A series of superlatticelike (SLL) structure incorporated with two phase-change materials GeTe and Sb7Te3 was applied in lateral phase change memory. Power consumption and lifetime were used as two criteria to optimize the SLL structure. It was found that with the thickness ratio of GeTe to Sb7Te3 at 1.6, the RESET current could be as low as 1.5 mA and the endurance could reach as high as 5.3×106 cycles. By varying the thickness ratio of GeTe to Sb7Te3, the crystallization temperature of SLL structures and the performance of lateral phase change memory with these SLL structures can be controlled.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
