Study of the set and reset transitions in HfO2-based ReRAM devices using a capacitor discharge

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In this work, we have studied the set and the reset transitions in hafnium oxide-based metal–insulator-metal ReRAM devices using a capacitor discharge. Instead of applying a conventional voltage or current signal, we have discharged a capacitor through the devices to perform both transitions. In this way, both transitions are shown to be controllable. An accumulative process is observed if we apply consecutive discharges, and, when increasing the capacitor voltage in each discharge, the transitions between both resistance states are complete. In addition, it has been shown that faster transitions require larger capacitor voltages.