Abstract
The possibility of using the thermal square wave method at single frequency for the analysis of the polarization distribution over the depth of a thin-film ferroelectric has been considered. The temperature distribution in a ferroelectric film-substrate system has been calculated. The method has been tested using tin thiohypodiphosphate films on aluminum substrates.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
