Abstract
AbstractA simple one‐dimensional thermal model of the electromigration phenomenon shows that the usual measurement methods of the temperature during lifetime tests usually lead to an erroneous determination of Black's relation parameters n and Q. The effects of the current density and the temperature estimation method on the errors on n and Q are analysed. An estimation of the temperature of the site where the flux divergence is maximum allows us to understand the behaviour of n and Q. The difference between real and apparent activation energy, at low current densities, is also calculated.
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