Abstract
XPS spectra have been obtained from six metals in the first row of transition elements using a Kratos AXIS HS x-ray photoelectron spectrometer. The six metals analyzed include Cu, Ni, Zn, V, Ge, and Fe. Each sample was Ar+ ion etched before XPS analysis to remove the majority of C and O contamination. The spectra include standard survey scans and high-resolution scans of the photoelectron peaks, as well as x-ray induced Auger peaks. Each spectrum was collected using a monochromatic Al Kα x-ray source operated at 300 W (20 mA, 15 kV). Survey scans were collected using an 80 eV pass energy, while high resolution scans were recorded using a 20 eV pass energy unless indicated otherwise.
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