Abstract
XPS spectra have been obtained from 11 metals in the third row of transition elements using a Quantum 2000 Scanning ESCA Microprobe. The metals analyzed include La, Hf, Ta, W, Re, Ir, Pt, Au, Tl, Pb, and Bi. Each sample was Ar+ ion etched before XPS analysis to remove surface contamination and/or oxide. The spectra include standard survey scans and high-energy resolution scans of the photoelectron peaks, as well as selected x-ray induced Auger peaks. Each spectrum was collected using a 100 μm diameter monochromatic Al Kα x-ray beam scanned over a 1.5 mm × 0.2 mm area of each sample. Survey scans were collected using a 58.7 eV pass energy, while high energy resolution scans were collected using a 23.5 eV pass energy.
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