Abstract
Photon-stimulated desorption (PSD) was studied by using synchrotron light at a critical energy of 2.14 keV from the 1.5 GeV Taiwan Light Source. Samples of aluminum alloy (Al) and oxygen-free-high-conductivity copper (Cu) was studied at the 19B(PSD) beam line of the Synchrotron Radiation Research Center for exposure measurement. The yields of photoemission and the PSD are measured at different exposure beam doses. The result shows a decrease of the PSD yield for each gas and a decreased yield of photoemission at higher beam doses on the samples. The transient curves of pressure rise for each PSD molecule illustrate a longer delay time τ of the peak after exposing the surface with higher beam dose D. The delay time of H2O and O2 are longer than that of CO, CO2, CH4, etc., in the case of both Al and Cu samples. In this work, it is found that τ∼Dα, with 0.5<α<1, in cases where D<2000 mA h. The discrepancy between the Al and Cu samples is not much different at higher beam doses. The processes of the chemical reactions by the photoelectrons and diffusion in the surface oxide layer are suspected to conduct the dose-dependent PSD phenomena.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
