Abstract
PbTiO3/BiFeO3 (PB film), BiFeO3/PbTiO3 (BP film) multilayer structural films and pure BiFeO3 film (BFO film) have been deposited on LaNiO3/SiO2/Si substrates by the sol–gel process annealed at 600 °C. XRD results indicate that the films are well crystallized and no impure phases are observed. The results of ferroelectricity show that the PB film and BP film have larger polarization than the BFO film under the same applied electric field. The double remanent polarizations of the PB film, the BP film and the BFO film are 82.2 µC cm−2, 85.6 µC cm−2 and 3.5 µC cm−2 under 500 kV cm−1, respectively. The dielectric property study shows that the multilayer structural films have a larger dielectric constant and dielectric loss than the BFO film. Leakage current is found to be reduced in the multilayer structural films.
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