Study of the biased-disc effect using Langmuir-probes inserted in the hot region of the electron cyclotron resonance ion source (ECRIS) plasma

Abstract

The plasma potential and its distribution play an important role in the highly-charged ion production and it is an important parameter of the electron cyclotron resonance (ECR) plasma. Emitting probes have been successfully used to determine plasma potential distributions in many plasma machines. In the framework of the ATOMKI–ECRIS plasma diagnostics research project, plasma-induced emitting probe was developed. It was proved that in certain conditions such probes could be reliably used without being damaged and without disturbing the plasma. Important observations were made related to the biased-disc effect. In favor of establishing the method of emitting probe usage in ECR plasma, dedicated experiments were performed at the NIRS–Kei2 all permanent compact ECR ion source. Based on the experiences gained after the NIRS experiments, the ATOMKI plasma-induced probe measurements could be interpreted. It was shown that biasing the Disc electrode negatively with respect to the source potential, the plasma potential measured on the resonant zone decreased, while the well-known ion beam current increase was obtained. This result proves the previous assumption [K.E. Stiebing, O. Hohn, S. Runkel, L. Schmidt, H. Schmidt-Böcking, V. Mironov, G. Shirkov, Phys. Rev. ST Accel. Beams 2 (1999) 123501], that the biased-disc changes the plasma potential distribution creating favorable conditions for ion beam extraction.