Abstract
A sinusoidal surface roughness model is adopted for the analysis of the effects of roughness amplitude and wavelength on pressure profile, film shape, minimum film thickness and coefficient of friction in a steady state EHL line contact. The influence coefficients used for the evaluation of surface displacements are calculated by utilizing a numerical method based on Fast Fourier Transform. Significant reduction is observed in the minimum film thickness due to surface roughness. Such reduction is quantified by roughness correction factor, C R, and a relationship between C R and non-dimensional surface roughness amplitude A is derived as: C R=1−0.7823 A 0.8213. This equation may prove to be of interest from designer's viewpoint. The friction coefficient is found to increase appreciably with increasing amplitude and decreasing wavelength of surface roughness.
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