Study of Structural and Optical Properties of Non-Oxide Se90Cd10–xSbx(2 ≤ x ≤ 8) Chalcogenide Thin Films

Abstract

Thin films of Se90Cd10–xSbx (2 ≤ x ≤ 8) of thickness 0.4 microns were prepared on ultra-clean glass substrate by thermal evaporation technique. The vacuum level was 10–6 torr. This paper intends to investigate the impact of Sb concentration on the optical characterization. XRD measurement has been done to investigate the Structural characterization of the prepared thin films. XRD result indicates the prepared thin have amorphous nature. To analyze the optical characterization of the thin films the absorption spectra were recorded over 400–1100 nm wavelength range. In the present study the optical absorption follows direct allowed transition. An increase in photon energy causes an increase in absorption coefficient while extinction coefficient has been found to increase with an increase in frequency of the photons i.e., deceases with increase of wavelength. Optical bandgap (Eg) of thin films have been studied and an increase in it has been recorded with increasing Sb concentration.