Abstract
Thermal evaporation technique was used for deposition of thin film of sulphur based chalcogenide glass on ultra-cleaned glass substrate. Thin film deposited onto glass substrate is characterized by means of XRD, SEM, DSC and UV-Vis spectrophotometer. Optical characteristics of thin films were obtained by absorption spectra measured in spectral range from 300–1000 nm. The optical constant e.g. extinction coefficient (k), optical band gap (Eg), absorption coefficient (k) and refractive index (n) are obtained in the present paper. It was observed that by increasing photon energy ( $\mathrm{h}\nu$ ) absorption coefficient increases and by increasing wavelength extinction coefficient decreases.
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