Abstract
The main ideas of the Frequency Fluctuation Model (FFM), devloped to calculate line shapes emitted by multi electron ions in hot and dense plasmas, are summarized. The line shape code which has been based on the FFM is particularly useful in accounting for the so-called ion dynamics effect and permits the tracing of the relevant inhomogeneous characteristics of the radiative patterns at each stage of the calculations. Information about the inhomogeneities of a given line is collected through a numerical coarse-graining process giving rise to microfield dressed two-level systems. These systems mimic the main features of the radiative properties of the emitter and are used as a basis to model the radiative redistribution function, a second order plasma radiative property. The second order theory is discussed and a few examples, calculated for complex emitter systems, are shown.
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