Abstract
The electrodeposition of ZnO nanostructures on ITO substrates was investigated by cyclic voltammetry, chronoamperometry and X-ray diffraction techniques. The potential deposition-dependent nucleation and growth mechanism of electrodeposited ZnO were studied by using the Scharifker–Hills nucleation model. From the analysis of the experimental current transients, the nucleation is in a good agreement with the instantaneous nucleation and three-dimensional (3D) diffusion-limited growth. X-ray diffraction measurements indicated that the as-grown films were of hexagonal wurtzite phase with a high crystalline quality.
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