Abstract
FePt/FeMn bilayers were deposited onto MgO (100) substrates by ion beam sputtering system. The dependence of in-plane and out-of-plane exchange bias fields (HE) and coercive fields (HC) on the thicknesses of both ferromagnetic (FM) and antiferromagnetic (AF) layers has been investigated. The out-of-plane exchange bias field is half of the value of the in-plane exchange bias field, which is may be due to the dispersion of anisotropy of FePt layer or may be because of the alignment of the spins of FeMn layer. The FM thickness dependence of in-plane and out-of-plane exchange bias is similar; however, the AF thickness dependence of out-of-plane exchange bias is different from that of the in-plane case.
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