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Abstract
An atomic force microscopy (AFM) system operating at low temperatures and under ultra high vacuum (UHV) conditions is presented. The AFM system uses the laser beam deflection method to detect the cantilever deflection. The system was completely developed in our laboratory for studying biological samples [A. Radenovic et al.: Rev. Sci. Instrum. 74 (2003) 1022]. To study DNA by AFM requires a substrate on which the DNA can be adsorbed from an aqueous solution. Images of DNA at room temperature and at low temperatures on three different surfaces are presented, including the first images of DNA on the treated HOPG obtained at 82 K. The importance of the hydrophobic degree of the substrate for imaging DNA at low temperatures is discussed.
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