Studies on temperature variation in semiconductor waveguide through ARDP loss for nanophotonic applications

Abstract

Studies on temperature variation in InSb and InAs compound semiconductor waveguide through ARDP losses at wavelength 10.6μm are reported in this work. Here ARDP losses are nothing but absorption, reflection, diffraction and polarization losses, which are frequently encountered as serious problem in optical semiconductors. In this paper these losses are analyzed with respect to different temperatures, which vary from 100K to 240K for InSb and 100K to 220K for InAs. Plane wave expansion method is used to obtain reflection losses, where Maxwell's curl equation is used to find absorption loss. Simulation is also made for diffraction and polarization efficiencies. Simulation results revealed that reflectance and diffraction efficiency increases with increasing of temperature, where polarization efficiency decreases with same temperature. Finally intensity transmitted through semiconductor decreases from 1.322mW/m2 to 1.296mW/m2 for InSb, where transmitted intensity increases from 2.218mW/m2 to 2.267mW/m2 for InAs with respect to above temperatures. Apart from this, it is seen that the variation of transmitted intensity with respect to temperature (100K to 240K for InSb and 100K to 220K for InAs) is nicely fitted with linear trend line (R2=0.994 for InSb and R2=0.992 for InAs), which leads to an accurate investigation of temperature in InSb and InAs compound semiconductor.