Abstract
Structural, optical and magnetic properties of Zn0.96Li0.02Cu0.02O and Zn0.98−xMgxCu0.02O (x = 0.00, 0.02, 0.08) films grown by pulsed laser deposition (PLD) on a glass substrate coated with indium tin oxide (ITO) are presented in this paper. X-ray diffraction (XRD) measurements confirmed good structural quality without any impurity. No E2(high) mode is observed in Raman spectra, possibly due to the breaking of translational symmetry caused by the intrinsic defects or by the dopant. Optical measurements show an increase in the bandgap of Mg- and Li-doped Cu:ZnO films with respect to that of Cu:ZnO film. Extended x-ray absorption fine structure spectroscopy (EXAFS) measurements at the Zn K-edge show some change in the coordination number, but no significant change was observed in the bond distances of the first and the second shells. The mean square relative displacement σ2 increases with doping, indicating higher disorder in films caused by Mg and Li doping. No evidence of ferromagnetism is found in these films at 300 K.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
