Abstract
Co/Sm multilayer films with structure of 20 [Co (x nm)/Sm (1.2 nm)] where x = 1.1, 2.2 and 4.2 nm and 20[Co (4.2nm)/Sm (x nm)] where x=1.2 nm to 7.5 nm were fabricated using dc magnetron sputtering. Each multilayer filmconsisted of 20 bilayers of Co layers with various thicknesses sandwiched with Sm layers. The application of lowangle X-ray diffraction measurements to the characterization of these multilayers is described. The periodiclayered structure with sharp interfaces was observed for all multilayer films. The measured magnetization valuesare lower than the values calculated in terms of the nominal concentration of cobalt in the multilayers. This impliessignificant “mixing” at small film thickness. The formation of a high magneto crystalline anisotropy of CoSm alloyat the interfaces, as a result of interdiffusion between Co and Sm layers was considered to be responsible for theincrease of the coercivity for Co/Sm multilayer.
Highlights
In recent year, cobalt based alloys in the form of thin films and thin film multilayer structures consist of alternate magnetic and non magnetic layers of manometer thickness have attracted much attention due to their magnetic properties
Each multilayer film consisted of 20 bilayers of Co layers with various thicknesses sandwiched with Sm layers of 1.2 nm thick
Co 5 nm CONCLUSION Multilayer films of Co/Sm were investigated in order to explore their intrinsic properties and to modify their magnetic properties via interdiffusion between the Co and Sm layers
Summary
Cobalt based alloys in the form of thin films and thin film multilayer structures consist of alternate magnetic and non magnetic layers of manometer thickness have attracted much attention due to their magnetic properties. Attempts to grow CoSm alloys in the form of thin films exhibiting large coercivity values were carried out by (Theuerer et al, 1969; Gronou et al, 1983), reported that CoSm films with high coercivity had been prepared by flash evaporation on glass substrates They suggested that these films could be used as a highdensity magnetic recording medium. (1989; 1990) Work on multilayer films in which the nonmagnetic layer is composed of a rare earth and metalloid elements has been carried out for ferromagnetic materials forming the ferromagnetic layers It was reported by Petford-Long et al, (1990) that interfacial mixing exists for the Co/W structure that affects the magnetic properties. Multilayer films of alternatively deposited ferromagnetic and nonmagnetic layers are proving to be important for understanding the fundamental physics of interacting magnetic films
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