Abstract
This paper reports the study of some physical properties of thin films of tin oxide, such as the structural properties, surface morphology and optical transmission and reflection. The thin films of tin oxide were deposited by the method of thermal evaporation under vacuum. Transmission electron microscopy (TEM) was used to study the structural properties and the atomic force microscopy (AFM) method was used to study the surface morphology of thin films of tin oxide. The absorption and extinction coefficients of the investigated thin layers were determined from the transmittance and reflectance spectra recorded in the range of wavelengths between 190 and 1100 nm.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Annals of the ”Dunarea de Jos” University of Galati. Fascicle II, Mathematics, Physics, Theoretical Mechanics
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
