Abstract
Nickel oxide (NiO) thin films were prepared by Chemical Bath Deposition (CBD) method. X-ray diffraction (XRD) analysis was used to study the structure and crystallite size of NiO thin film. The surface morphology was studied using scanning electron microscopy (SEM). The optical properties were studied using the UV-Visible spectrum. The dielectric properties of NiO thin films were studied at different frequencies and different temperatures.
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