Abstract
Secondary ion mass spectrometry (SIMS) measurements on deuterium-containing vanadium and niobium foils and hydrogen-containing LaNi5 slices were carried out in order to investigate the secondary ion emission behaviour as a function of the hydrogen (deuterium) content and the primary ion current density. In the case of VDX and NbDX the secondary ion Me2D+ exhibits maximum intensity among all cluster ions containing deuterium and is therefore the most significant one for deuterium detection. This behaviour is obviously due to the high stability of Me2D+ deuteride phase of these metals. Regarding the system LaNi5HX, the situation is more complicated because of the different sites that can be occupied by hydrogen in this host lattice. Besides a small LaH+ signal the SIMS spectra shows NiH2− and Ni2H− to be the most significant secondary ions. This observation points to a high association of hydrogen with nickel in ion-bombarded LaNi5 and to an obvious pre-formation of a nickel dihydride in the LaNi5 matrix. Furthermore, the emission of NiX− signals is enhanced owing to the presence of hydrogen.
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