Abstract
The present research work represents the numerical study of the device performance of a lead-free Cs2TiI6-XBrX-based mixed halide perovskite solar cell (PSC), where x = 1 to 5. The open circuit voltage (VOC) and short circuit current (JSC) in a generic TCO/electron transport layer (ETL)/absorbing layer/hole transfer layer (HTL) structure are the key parameters for analyzing the device performance. The entire simulation was conducted by a SCAPS-1D (solar cell capacitance simulator- one dimensional) simulator. An alternative FTO/CdS/Cs2TiI6-XBrX/CuSCN/Ag solar cell architecture has been used and resulted in an optimized absorbing layer thickness at 0.5 µm thickness for the Cs2TiBr6, Cs2TiI1Br5, Cs2TiI2Br4, Cs2TiI3Br3 and Cs2TiI4Br2 absorbing materials and at 1.0 µm and 0.4 µm thickness for the Cs2TiI5Br1 and Cs2TiI6 absorbing materials. The device temperature was optimized at 40 °C for the Cs2TiBr6, Cs2TiI1Br5 and Cs2TiI2Br4 absorbing layers and at 20 °C for the Cs2TiI3Br3, Cs2TiI4Br2, Cs2TiI5Br1 and Cs2TiI6 absorbing layers. The defect density was optimized at 1010 (cm-3) for all the active layers.
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