Abstract
We review recent achievements of magnetic full-field soft X-ray transmission microscopy. This technique allows for an element-specific imaging of magnetic domain structures in thin films and nanopatterned elements. With a lateral resolution down to 15 nm, the ability to record images in external magnetic fields and the application of stroboscopic pump-and-probe schemes detailed insights into fundamental mechanisms of micromagnetism can be obtained which are relevant in the development of high density and ultrafast magnetic storage and sensor technologies.
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