Abstract
Atomic force microscopy and scanning tunneling microscopy can image the internal structure of molecules adsorbed on surfaces. One reliable method is to terminate the tip with a nonreactive adsorbate, often a single CO molecule, and to collect data at a close distance where Pauli repulsion plays a strong role. Lateral force microscopy, in which the tip oscillates laterally, probes similar interactions but has the unique ability to pull the CO over a chemical bond, load it as a torsional spring, and release it as it snaps over with each oscillation cycle. This produces measurable energy dissipation. The dissipation has a characteristic decay length in the vertical direction of 4 pm, which is 13 times smaller than the decay length in typical STM or AFM experiments.
Highlights
One of the most important developments in the application of frequency-modulation atomic force microscopy (FM-AFM) to the study of molecular adsorbates was the demonstration that by picking up a single CO molecule, the tip could approach the adsorbate and acquire data of the internal structure [1]
Lateral force microscopy is a variant of atomic force microscopy in which the tip is slid over the surface while the lateral forces are recorded [6]
We perform frequency-modulation lateral force microscopy (LFM) in which the tip is driven to oscillate at a set amplitude above the surface [9,10]
Summary
One of the most important developments in the application of frequency-modulation atomic force microscopy (FM-AFM) to the study of molecular adsorbates was the demonstration that by picking up a single CO molecule (a CO tip), the tip could approach the adsorbate and acquire data of the internal structure [1]. We perform frequency-modulation lateral force microscopy (LFM) in which the tip is driven to oscillate at a set amplitude above the surface [9,10]. We modified the probe-particle model to output the lateral force at each position of the metal apex atom.
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