Abstract
Solutions of fullerene C60 in toluene and p-xylene were investigated by small-angle X-ray diffraction. In all small-angle scattering curves, the scattering intensity decreases to constant value IC with an increase in the scattering angle. The value of IC nonmonotonically depends on the fullerene concentration. The radii of gyration of scattering elements were determined by constructing small-angle X-ray diffraction patterns in Guinier coordinates.
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