Abstract

Structure and accumulation behavior of ion tracks in CeO2 irradiated with 200 MeV Xe ions were examined by transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) to obtain fundamental knowledge on the microstructure evolution induced by fission fragments in nuclear fuels and transmutation targets, which is of importance for the development of advanced fuel/target materials at high burn-up conditions. Bright-field (BF) TEM images of ion tracks from an inclined direction showed Fresnel contrast along penetrating path of incident ions. The signal intensity of high-angle annular dark-field (HAADF) STEM images was decreased at the core damage region of ion tracks along the path of ions, revealing the reduction of atomic density inside the ion track. Preferential formation of smaller and larger ion tracks was observed at a high ion fluence of 1 × 1014 cm−2 compared to a low ion fluence of 1 × 1011 cm−2. Results were discussed due to the coalescences and incomplete recovery of the core damage regions during the overlap of high density electronic excitation damage, which is induced during the repetition of the formation and recovery of ion tracks within an influence region.

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