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https://doi.org/10.1246/cl.1988.765
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Cite Journal: Chemistry Letters |  Publication Date: May 5, 1988 |
Affiliation: Tokyo Institute of Technology
Abstract Thin films of uracil were prepared by vacuum evaporation. The stacking structure of the molecules in the films were investigated using a transmission electron microscope(TEM) and electron diffraction analysis. The films showed a substantially higher sensitivity for ultraviolet(UV) light irradiations.
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