Abstract
Single crystals of AxBa8-xAl14Si31 (A = Sr, Eu) were grown using a molten Al flux technique. Single-crystal X-ray diffraction confirms that AxBa8-xAl14Si31 (A = Sr, Eu) crystallize with the type I clathrate structure, and phase purity was determined with powder X-ray diffraction. Stoichiometry was determined to be Sr0.7Ba7.3Al14Si31 and Eu0.3Ba7.7Al14Si31 by electron microprobe analysis. These AxBa8-xAl14Si31 phases can be described as framework-deficient clathrate type I structures with the general formula, AxBa8-xAlySi42-3y/4[]4-1/4y. DSC measurements indicate that these phases melt congruently at 1413 and 1415 K for Sr0.7Ba7.3Al14Si31 and Eu0.3Ba7.7Al14Si31, respectively. Temperature-dependent resistivity indicates metallic behavior, and the negative Seebeck coefficient indicates transport processes dominated by electrons as carriers. Thermal conductivity of these phases remains low with Sr0.7Ba7.3Al14Si31 having the lowest values.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
