Abstract
The paper provides information on the growth of SrTiO3/Si (001) (STO/Si) and 0.5BiFeO3–0.5PbFe0.5Nb0.5O3/SrTiO3/Si (001) (BFO-PFN/STO/Si) composite heterostructures. BFO–PFN/STO/Si composite thin films were deposited on Si substrate by RF-cathode sputtering using STO as buffer layer for textured growth. The use of STO enhanced the orientation for the perovskite phase growth of the BFO–PFN films, which was confirmed by XRD. It was shown that the BFO–PFN layer in the BFO–PFN/STO/Si heterostructures suffered a strain and thus their physical properties were modified. The optical properties of the STO/Si pseudo-substrate were studied in detail.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
