Abstract

The structure, growth and morphology of ultrathin Cr films on Cu(100) were investigated using Auger electron spectroscopy (AES), and low and medium energy electron diffraction (LEED and MEED). From the LEED pattern and the measurements of LEED I V curves the structure of the Cr films was determined. By comparison with full dynamical calculations the resulting structure is identified as bcc Cr which grows with the (110) surface parallel to the Cu(100) substrate. The atomic positions within the film closely resemble the positions of bulk Cr. MEED and AES reveal that Cr grows in three-dimensional islands on the Cu(100) surface for the temperature range studied (200–470 K). The structure and growth of the Cr films is compared with the similar epitaxial system of Fe on Cu(100).

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