Abstract
The growth and structure of ultra-thin Cr films deposited on a Co(0001) single crystal are investigated for substrate temperatures ranging from 300 to 500 K by means of Auger electron spectroscopy, low energy electron diffraction and photoemission. For room temperature growth, the interface is sharp and the Cr layers arrange in a Nishiyama-Wassermann-type epitaxy. At elevated temperatures the interface is diffuse and a Kurdjumov-Sachs orientation is observed.
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