Structural, thermal and electrical properties of Ti4+ substituted Bi2O3 solid systems

Abstract

In the present study, the effect of TiO2 doping on (1−x) Bi2O3 (x)TiO2 (x=0.05, 0.10, 0.15, 0.20) materials is investigated using X-ray diffraction (XRD), differential thermal analysis (DTA), ac conductivity, scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS). XRD results show the formation of single phase Bi12TiO20 at x≥0.15 concentration of TiO2. It is observed that, the lower concentration of TiO2 leads to the formation of mixed phase. The x=0.15 and x=0.20 samples exhibit regular and uniform distribution of the grains as compared to x=0.10 sample. The highest conductivity is observed for x=0.15 specimen, e.g., 9×10−7Scm−1.