Abstract
The structural properties of magnetic garnets which are specific to films or are particularly relevant to film characterization are discussed. Structural deformations and the deviations from cubic symmetry which result from the film-substrate lattice misfit and from the consequent stress in the film are considered. Corrections which enable the structural properties of a strain-free film to be determined are described. Several X-ray diffraction methods for characterizing thin layers within films are reviewed, with particular emphasis on their applications to the study of ion-implanted surface layers in magnetic bubble films. Many types of structural defect present in films grown by liquid phase epitaxy, which affect film performance in device applications, are described. In particular, substrate defects that are replicated by the epitaxial films are treated separately and defects which are induced during growth by film-substrate lattice misfits or by subsequent annealing treatments in various atmospheres are discussed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
