Abstract
Using x-ray-absorption fine-structure measurements we have obtained clear evidence for structural anisotropy in amorphous sputter-deposited TbFe films exhibiting perpendicular magnetic anisotropy. Modeling of the data shows that perpendicular anisotropy in these films is associated with Fe-Fe and Tb-Tb pair correlations which are greater in plane and Tb-Fe correlations which are greater perpendicular to the film plane. Upon annealing at 300 \ifmmode^\circ\else\textdegree\fi{}C the measured structural anisotropy disappears and the magnetic anisotropy decreases to a level consistent with magnetoelastic interactions between the film and substrate.
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