Abstract
Nowadays, Semiconducting thin films are the efficient candidates for good optical and electrical properties. In this study, the thin films of pure V2O5 together with 2 different molarities were prepared through the method of spray Pyrolysis. The prepared thin films were characterized by spectrographic tools such as XRD, FT-IR, UV-Vis and Hall effect to study their, crystalline nature, Functional group, band gap, resistivity, conductivity and mobility of the flow of electrons respectively. The structural morphology of the synthesized thin films was discussed through the micrographic image obtained from Scanning electron microscopy together with their surface occupancy plots. The obtained minimum crystallite size is about 26.8 nm for 4% molarities. The morphological and structural studies show enhanced results for 4% sample which makes it a viable candidature for optical and electrical applications.
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