Abstract
Abstract: This paper deals with depositing a CuS thin film on a glass substrate at 3800C by using spray pyrolysis method. Its optical properties and electric properties are characterized after cooling the sample. Formation for compound, structure and morphology were studied using x-ray diffraction. The optical study comprised the extraction and analysis of calculated optical constants, such as absorption coefficient (α), transmittance, extinction coefficient (k), which revealed the presence of a direct optical energy band gap of 2.0 eV. The temperature-dependent electrical resistivity with other necessary parameters was systematically studied for CuS film in the present work. Overall study confirmed the semiconducting behavior of the film which is useful for many applications, even when the film is touching the substrate at a micrometer scale with spray pyrolysis. This paper also explores the optical conductivity, dielectric constant, Urbach energy, morphology and thermal activation energy of the CuS film with explaining methodological details. Keywords: Thin film, Spray pyrolysis technique, Electrical and optical properties, XRD.
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