Abstract
Chromium substituted M-type hexagonal ferrites with nominal composition Pb1-xCrxFe12O19 where x= (0.0, 0.1, 0.2, 0.3, 0.4, 0.5) were prepared via sol gel route. Structure of the single phase lead hexaferrite was estimated from X-ray diffraction (XRD) analysis. Scanning electron microscopy (SEM) confirmed the formation of hexagonal platelets with an average grain size in the range of 53–63 nm. Crystallite size, lattice parameters and cell volume was found to decrease with the increase of Chromium concentration. Magneto crystalline anisotropy and saturation magnetization has been explored through the law of approach to the saturation magnetization. Saturation magnetization first increased and then found to be maximum (64 emu/g) at 30% of Cr3+ doped lead hexaferrite and minimum coercivity (6.54 KOe) was perceived for this composition. Dielectric constant, dielectric loss, tangent loss, real and imaginary part of electric modulus, ac conductivity and Q-values of the prepared samples were also explained. With the increase of dopant (Cr3+) concentration, dielectric constant was increased gradually. These characteristics are suitable for various applications such as phase shifter, modulators, stealth technologies and also in Multilayer chip inductor.
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