Abstract
Interaction of a nanosecond high-intensity pulsed ion beam with thin graphene films on copper substrates is analyzed. Methods of Raman spectroscopy are used to investigate the degree of graphene degradation depending on the integral implanted dose. The role of the substrate in the structural degradation of graphene irradiated by charged particle beams is demonstrated using the software package SRIM, intended for modeling radiative defect cascades under irradiation by charged particle beams, and the data on radiation resistance of graphene available in the literature.
Highlights
Graphene – a 2D carbon structure – attracts attention of scientific community for solving fundamental problems and practical application since its discovery [1]
Among the main graphene modes are the following modes: the G mode (~1580 cm–1) attributed to oscillations of sp2 carbon atoms along the graphene planes; the 2D mode (~2748 cm–1; the position of the given mode depends on the excitation energy) attributed to two-photon resonance whose halfwidth is an important indicator of the number of graphene layers; and the D mode (~1362 cm–1) attributed to breathing oscillations of the six-atom ring in the graphene crystal structure activated when the symmetry of the graphene lattice is broken
It is important to note that initially the carbon film prepared by the chemical vapor deposited (CVD) method is polycrystalline – consisted of graphene grains separated by defect areas and rotated relative to each other
Summary
Graphene – a 2D carbon structure – attracts attention of scientific community for solving fundamental problems and practical application since its discovery [1]. In some works (for example, see [7, 10]), the role of the substrate in the formation of defects in graphene during interaction with charged particle beams was pointed out, but
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