Abstract
(√3 × √3)R30°-Xe/Pd(111) and the dilute phase of Xe/Pd(111) were investigated with spin-polarized low-energy electron diffraction (SPLEED). In the experiment spin-polarized electrons from a GaAs source were scattered and the spin-dependent intensities were measured. Comparative calculations were carried out by means of a relativistic LEED program. The structure determination of (√3 × √3)R30°-Xe/Pd(111) yields a layer distance of 3.5 ± 0.1 A ̊ , the Xe atoms being adsorbed in hollow sites. In the dilute phase of Xe/Pd(111) the adsorbed Xe atoms occupy on-top sites with a Xe-Pd distance of 4.0 ± 0.1 A ̊ without two-dimensional periodicity.
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