Abstract
In the present work, Fourier transform infrared spectroscopy (FTIR), Raman spectroscopy, x-ray diffraction (XRD), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) were employed to ascertain the grafting of an organic layer of polyvinyl alcohol (PVA) onto the surface of semiconducting SiC nanocrystals using a novel method. FTIR spectroscopy reveals the introduction of new peaks corresponding to various functional groups of PVA alongwith the presence of characteristic Si–C vibrational peak in the spectra of grafted SiC nanocrystals. Raman spectra depict the presence of changes introduced in the characteristic TO and LO mode of vibration of SiC nanocrystals after grafting procedure. XRD analysis confirmed that the grafting procedure did not alter the crystalline geometry of SiC nanocrystals. TEM and SEM images further support the FTIR and Raman spectroscopic results and confirm the presence of PVA layer around SiC nanocrystals. Thermal degradation behavior of PVA-g-SiC nanocrystals has been studied using TGA analysis.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
