Abstract
Lead Selenide (PbSe) thin films are deposited by chemical bath deposition for 2 hours in different temperature. The precursors used are 0.2M of Lead (II) nitrate, 0.5M of Sodium Selenosulfate, 2.0M of Sodium hydroxide and 4ml of Triethanolamine. The film deposition is carried out at 50°C, 60°C, 70°C, and 80°C for 2 hours. The thickness of the film varied in the range from 1400 to 5200Å. The structural characterization of these films is carried out by X–ray diffractometar (JEOL-Japan, JDX 8030 model). The XRD pattern of PbSe films deposited at different temperature exhibit the polycrystalline structure. In the present study, Scanning Electron Microscope (JOEL 840 SEM/EDAX) is employed to analyze the surface morphology of the films. In addition, the compositions of the films are estimated from EDAX Spectrum. Therefore, it is observed that the films deposited in this work, possess strong peaks for Pb and Se and no other impurities are detected through the EDAX Spectrum, confirming high purity of the PbSe thin film.
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