Structural and redox properties of VOxand Pd/VOxthin film model catalysts studied by TEM and SAED

Abstract

The oxidation of pure V(2)O(3) and Pd/V(2)O(3) films was studied by Transmission Electron Microscopy (TEM) and Selected Area Electron Diffraction (SAED) in the temperature range 673-773 K. Thin films of V(2)O(3) were prepared by reactive deposition of V metal in 10(-2) Pa O(2) on NaCl(001) cleavage faces. Pd particles were epitaxially grown on NaCl(001) and subsequently embedded in V(2)O(3). Oxidation of both pure V(2)O(3) and Pd/V(2)O(3) at 673 K transforms V(2)O(3) into a platelet-like V(2)O(5) structure. At temperatures T>or= 773 K, a reconstruction of the platelet-like V(2)O(5) structure into an array of oblong and needle-type V(2)O(5) nanocrystals of different size occurs. Subsequent reduction of the so-prepared structures in 1 bar H(2) at 573-673 K results in the formation of the cubic VO phase, whereby the external shape of the original crystals is partially maintained. Upon oxidation at 723 K, Pd is transformed into PdO, but its formation is suppressed in comparison with Pd supported on Al(2)O(3) and occurs only at an about 100 K higher temperature than on Pd/Al(2)O(3). The Pd particles are stabilized against oxidation up to 673 K, PdO decomposes upon reduction in hydrogen between 573 and 673 K.